Title :
Enhanced responsivity in a novel AlGaN / GaN plasmon-resonant terahertz detector using gate-dipole antenna with parasitic elements
Author :
Tanigawa, Tatsuya ; Onishi, Toshikazu ; Takigawa, Shinichi ; Otsuji, Taiichi
Author_Institution :
Semicond. Device Res. Center, Panasonic Corp., Kyoto, Japan
Abstract :
In this paper, we present a novel AlGaN/GaN heterojunction FET which can detect THz radiation directly at a gate electrode with high responsivity. We present a novel AlGaN/GaN THz detector utilizing the plasmon resonance. The device has a simple HFET structure in which the gate is used as a dipole antenna and the source/drain are used for the parasitic elements of it to increase the gain. The device is free from the long transmission line so that very high responsivity of 1.1x103 V/W is attained by reducing the propagation loss. The presented THz detector with high sensitivity is useful for future THz applications.
Keywords :
dipole antennas; high electron mobility transistors; plasmons; terahertz wave detectors; AlGaN-GaN; HFET structure; THz radiation detection; enhanced responsivity; gate electrode; gate-dipole antenna; heterojunction FET; parasitic elements; plasmon-resonant terahertz detector; propagation loss reduction; transmission line; Detectors; Electrooptical waveguides; Gallium nitride; HEMTs; Logic gates; MODFETs;
Conference_Titel :
Device Research Conference (DRC), 2010
Conference_Location :
South Bend, IN
Print_ISBN :
978-1-4244-6562-0
Electronic_ISBN :
1548-3770
DOI :
10.1109/DRC.2010.5551895