• DocumentCode
    1627598
  • Title

    Criticality of detailed modeling in semiconductor supply chain simulation

  • Author

    Jain, Sanjay ; Lim, Chu-Cheow ; Gan, Boon-Ping ; Low, Yoke-Hean

  • Author_Institution
    Gintic Inst. of Manuf. Technol., Singapore
  • Volume
    1
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    888
  • Abstract
    Supply chain management offers a large potential for organizations to reduce costs and improve customer service performance. Simulation of supply chains can help in these objectives by evaluating the impact of alternative inventory control policies. Supply chain simulation involves the modeling of multiple factories across the chain and can get quite complex. Analysts typically carry out such simulation at a coarse level of detail to keep the complexity and computing resources manageable. However, modeling at coarse levels may reduce the accuracy of outputs and affect the quality of decisions. In this paper, we report on a study to compare the quality of results at different levels of detail in a semiconductor supply chain simulation
  • Keywords
    discrete event simulation; electronics industry; logistics data processing; semiconductors; stock control data processing; complexity; cost reduction; customer service performance; decision quality; detailed modeling criticality; inventory control policies; level of detail; multiple factories; output accuracy; semiconductor supply chain simulation; supply chain management; Computational modeling; Costs; Electronics industry; Investments; Manufacturing; Production facilities; Semiconductor device manufacture; Supply chain management; Supply chains; Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference Proceedings, 1999 Winter
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    0-7803-5780-9
  • Type

    conf

  • DOI
    10.1109/WSC.1999.823302
  • Filename
    823302