Title :
Indium single ion optical frequency standard
Author :
Becker, Th ; Eichenseer, M. ; Nevsky, A. Yu ; Peik, E. ; Schwedes, Ch. ; Skvortsov, M.N. ; Zanthier, J.V. ; Walther, H.
Author_Institution :
Max-Planck-Inst. fur Quantenoptik, Garching, Germany
fDate :
6/23/1905 12:00:00 AM
Abstract :
A single laser cooled ion in a radiofrequency trap can serve as the basis for a highly stable optical frequency standard. We present recent results of our work on single indium ions, using the 1S0 to 3P0 transition at 236.5 nm wave-length as the clock transition. This resonance has a linewidth of only 0.82 Hz where systematic shifts should be controllable on the mHz level. A single In+ ion is stored in a miniature Paul-Straubel trap and laser cooled to a temperature of about 100 μK. The clock transition is excited using a frequency quadrupled Nd:YAG laser. A fractional resolution of 1.3·10-13 has been achieved so far (linewidth of 170 Hz at 1267 THz). The absolute frequency of the clock transition clock transition has been measured with an uncertainty of 2·10-13 using a frequency chain and a methane-stabilized HeNe laser as a reference, that was calibrated with a cesium clock
Keywords :
atomic clocks; frequency stability; frequency standards; ground states; indium; laser cooling; measurement uncertainty; trapped ions; 100 muK; 1267 THz; 236.5 nm; In; In+ ion; Lamb-Dicke regime; absolute frequency; clock transition; forbidden optical transitions; frequency chain; frequency quadrupled Nd:YAG laser; ground state cooling; highly stable standard; methane-stabilized HeNe laser reference; miniature Paul-Straubel trap; motionless point-like absorber; optical atomic clock; optical frequency standard; perturbation-free environment; radiofrequency trap; single laser cooled ion; systematic shifts; two-ion Coulomb crystals; uncertainty; Charge carrier processes; Clocks; Control systems; Indium; Laser stability; Laser transitions; Particle beam optics; Radio frequency; Resonance; Temperature;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-7028-7
DOI :
10.1109/FREQ.2001.956163