• DocumentCode
    1627758
  • Title

    Resonant body transistors

  • Author

    Ionescu, Adrian M.

  • Author_Institution
    Nanolab, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2010
  • Firstpage
    181
  • Lastpage
    182
  • Abstract
    Subsequently, growing interest in wireless applications has generated tremendous technological progress in the field of radio frequency micro-electro-mechanical systems (RF MEMS) and transformed the MEM resonator technology based on IC-compatible micromachining processes and materials such as semiconductors, polysilicon or metals in a strong competitor position to the quartz crystal. Today, majority of the MEM resonators exploit the principles of capacitive excitation and detection via deep sub-micron air-gaps. However, MEM resonators with capacitively transduced signals are passive devices that show limited scaling potential in terms of impedance and signal-to-noise ratio. Inspired by the resonant gate transistor, vibrating or resonant body transistors (VBT or RBT) have been proposed for the first time in 2007-2008, by embedding a field effect transistor in the body of vibrating beams. Such devices could be envisioned for future complex collective electro-mechanical signal processing based on millions of resonant transistors interfaced with advanced CMOS on a single silicon chip.
  • Keywords
    field effect transistors; micromechanical resonators; IC-compatible micromachining process; MEM resonator technology; RF MEMS; advanced CMOS; capacitive excitation; capacitive transduced signals; collective electromechanical signal processing; detection via deep submicron air gaps; field effect transistor; passive devices; quartz crystal; radiofrequency microelectromechanical systems; resonant body transistors; resonant gate transistor; signal-to-noise ratio; single silicon chip; vibrating beams; Air gaps; Crystals; FETs; Logic gates; Metals; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2010
  • Conference_Location
    South Bend, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-6562-0
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2010.5551901
  • Filename
    5551901