DocumentCode :
1627758
Title :
Resonant body transistors
Author :
Ionescu, Adrian M.
Author_Institution :
Nanolab, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear :
2010
Firstpage :
181
Lastpage :
182
Abstract :
Subsequently, growing interest in wireless applications has generated tremendous technological progress in the field of radio frequency micro-electro-mechanical systems (RF MEMS) and transformed the MEM resonator technology based on IC-compatible micromachining processes and materials such as semiconductors, polysilicon or metals in a strong competitor position to the quartz crystal. Today, majority of the MEM resonators exploit the principles of capacitive excitation and detection via deep sub-micron air-gaps. However, MEM resonators with capacitively transduced signals are passive devices that show limited scaling potential in terms of impedance and signal-to-noise ratio. Inspired by the resonant gate transistor, vibrating or resonant body transistors (VBT or RBT) have been proposed for the first time in 2007-2008, by embedding a field effect transistor in the body of vibrating beams. Such devices could be envisioned for future complex collective electro-mechanical signal processing based on millions of resonant transistors interfaced with advanced CMOS on a single silicon chip.
Keywords :
field effect transistors; micromechanical resonators; IC-compatible micromachining process; MEM resonator technology; RF MEMS; advanced CMOS; capacitive excitation; capacitive transduced signals; collective electromechanical signal processing; detection via deep submicron air gaps; field effect transistor; passive devices; quartz crystal; radiofrequency microelectromechanical systems; resonant body transistors; resonant gate transistor; signal-to-noise ratio; single silicon chip; vibrating beams; Air gaps; Crystals; FETs; Logic gates; Metals; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2010
Conference_Location :
South Bend, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4244-6562-0
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2010.5551901
Filename :
5551901
Link To Document :
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