Title :
A 14-b, 0.1ps resolution coarse-fine time-to-digital converter in 45 nm CMOS
Author :
Huihua Huang ; Sechen, Carl
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
A 14-b, 0.1ps resolution interpolating coarse - fine Time-to-Digital Converter (TDC) has been developed in 45nm CMOS technology. It is based on an asynchronous buffer delay line and an RC delay line. A lookup-table (LUT) based calibration scheme was developed to correct non-linearities due to PVT variations.
Keywords :
CMOS digital integrated circuits; delay lines; time-digital conversion; CMOS technology; LUT-based calibration scheme; PVT variation; RC delay line; TDC; asynchronous buffer delay line; interpolating coarse-fine time-to-digital converter; lookup-table-based calibration scheme; nonlinearity correction; size 45 nm; word length 14 bit; CMOS integrated circuits; CMOS technology; Calibration; Delay lines; Delays; Table lookup; Wires; RC delay line; Time-to-digital converter (TDC); lookup-table (LUT); low power;
Conference_Titel :
Circuits and Systems Conference (DCAS), 2014 IEEE Dallas
Conference_Location :
Richardson, TX
DOI :
10.1109/DCAS.2014.6965319
