• DocumentCode
    1627858
  • Title

    Scalable transformer model based on ladder topological equivalent circuit for Si RFICs

  • Author

    Shiramizu, Nobuhiro ; Masuda, Toru ; Nakamura, Takahiro ; Washio, Katsuyoshi

  • Author_Institution
    Central Res. Lab., Hitachi, Ltd., Kokubunji, Japan
  • fYear
    2010
  • Firstpage
    12
  • Lastpage
    15
  • Abstract
    Scalable modeling methodology of on-chip spiral interleaved transformer is proposed. The novel equivalent circuit based on ladder topology is composed of lumped elements and their parameters are completely derived from the physical structure. The circuit topology enables to express the inductive and capacitive coupling effect between half turn segmented wires accurately. The circuit also contributes to obtain the scalability related to wire width/space, length, and diameter. In this model, coupling capacitance between adjacent wires is given by considering parallel paths through oxide layer and Si substrate. The model simulation result matched the measurement result of a fabricated transformer TEG with the error less than 5% for wide frequency range up-to quasi-millimeter wave band.
  • Keywords
    capacitance; coupled circuits; equivalent circuits; ladder networks; network topology; radiofrequency integrated circuits; silicon; transformers; RFIC; Si; adjacent wires; capacitive coupling effect; circuit topology; coupling capacitance; fabricated transformer TEG; inductive coupling effect; ladder topological equivalent circuit; lumped element; on-chip spiral interleaved transformer; scalable transformer model; Capacitance; Circuit simulation; Circuit topology; Coupling circuits; Equivalent circuits; Frequency measurement; Radiofrequency integrated circuits; Scalability; Spirals; Wires; On-chip transformer; coupling effect; ladder topology; scalable model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2010 Topical Meeting on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-5456-3
  • Type

    conf

  • DOI
    10.1109/SMIC.2010.5422954
  • Filename
    5422954