Title :
Enhancement in IEEE 1500 standard for at-speed test and debug
Author :
Ali, Ghazanfar ; Hussin, Fawnizu Azmadi ; Zain Ali, Noohul Basheer ; Hamid, Nor Hisham ; Adnan, Raja Mahmud
Author_Institution :
Electr. & Electron. Eng. Dept., Univ. Teknol. Petronas (UTP) Perak, Tronoh, Malaysia
Abstract :
IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability.
Keywords :
IEEE standards; automatic testing; IEEE 1500 standard; IEEE 1500-compliant cores; SAYEH processor; at-speed test; debug embedded cores; off-board tester; on-board tester; software based self-testing technique; Built-in self-test; Computer architecture; Registers; Standards; System-on-chip; Very large scale integration; Functional Debug; Functional Test; IEEE 1500 Standard; Software Based Self-Testing (SBST);
Conference_Titel :
Circuits and Systems Conference (DCAS), 2014 IEEE Dallas
Conference_Location :
Richardson, TX
DOI :
10.1109/DCAS.2014.6965327
