• DocumentCode
    162800
  • Title

    Perils of power prediction in early power-integrity analysis

  • Author

    Arun, Abhishek ; Stelmach, Shane ; Venkatasubramanian, Ramakrishnan ; Flores, Jose ; Jitlal, Colin ; Cano, Frank

  • Author_Institution
    Embedded Processor Bus. Unit, Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    2014
  • fDate
    12-13 Oct. 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Early power integrity and peak power analyses for multi-million gate system on chip (SoC) in advanced technology nodes pose significant methodology definition and implementation challenges. Typically in a SoC, processors and other high performance IPs are dominant contributors to peak power and power integrity issues. To get an early look ahead of potential power integrity issues and to estimate peak di/dt issues in the SoC, it is always desired to analyze potential issues early and address before a silicon failure. This paper presents an overview of implementation challenges faced in RTL based power for predictive power analysis and analyzing peak di/dt issues ahead of time in the context of TI C66× DSP core based multicore SoC.
  • Keywords
    digital signal processing chips; integrated circuit design; microprocessor chips; multiprocessing systems; system-on-chip; IP; RTL based power; TI C66× DSP core; early power integrity analysis; multicore SoC; multimillion gate system on chip; peak power analysis; power prediction; predictive power analysis; processors; technology nodes; Clocks; Digital signal processing; Estimation; Logic gates; Multicore processing; System-on-chip; Vectors; IR Drop analysis; Power Integrity; RTL based power; VCD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems Conference (DCAS), 2014 IEEE Dallas
  • Conference_Location
    Richardson, TX
  • Type

    conf

  • DOI
    10.1109/DCAS.2014.6965335
  • Filename
    6965335