• DocumentCode
    1628055
  • Title

    Revisiting the impact on sub-threshold regions in uniaxially-strained FETs

  • Author

    Na, M. H. ; McStay, K. ; Nowak, E. J.

  • Author_Institution
    IBM Semiconductor Research and Development Center, Hopewell Junction, New York, USA
  • fYear
    2010
  • Firstpage
    19
  • Lastpage
    20
  • Abstract
    Abstract withdrawn
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2010
  • Conference_Location
    Notre Dame, IN, USA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-6562-0
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2010.5551912
  • Filename
    5551912
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1628055