DocumentCode
1628290
Title
Programmable nanomagnet-logic majority gate
Author
Varga, Edit ; Niemier, Michael T. ; Bernstein, Gary H. ; Porod, Wolfgang ; Hu, X. Sharon
Author_Institution
Dept. of Elec. Eng., U. of Notre Dame, Notre Dame, IN, USA
fYear
2010
Firstpage
85
Lastpage
86
Abstract
We build on previous work and present the first experimental demonstration of a completely programmable NML majority gate. To ensure complete programmability, each driver magnet will need to be set independently. This can be accomplished by changing magnet aspect ratio. As the length of the magnet increases along its easy axis, its coercivity in that direction increases. Thus, it will require a higher magnetic field for re-magnetization. Quantitative simulation data are shown in Fig. 3 (obtained via simulations with NIST´s OOMMF suite2). The M-H curves show increasing coercivity for 60x90x30 nm3 and 60x230x30 nm3 supermalloy magnets. One can clearly see that a higher magnetic field is needed to switch that state of the higher aspect ratio magnet. Thus, if we vary the lengths of the driver (horizontal) magnets of the majority gate shown in Fig. 1c, and any applied external field is (i) sufficient to set the state of a target driver, (ii) insufficient to switch other (longer) driver(s), and (iii) sufficient to place the other (vertical) magnets in the gate into a metastable state (per Fig. 2), then the drivers can retain their distinct initial magnetization state even after the entire gate process is complete. This has been experimentally demonstrated and we discuss results below. We have demonstrated the independent programmability of the driver magnets of the majority gate to obtain all logic variations in one physical layout. This demonstrates fully programmable logic which is especially important when considering how to use this technology at the functional unit level.
Keywords
logic gates; magnetic devices; magnetisation; nanomagnetics; programmable logic devices; driver magnet; functional unit level; gate process; magnet aspect ratio; magnetic field; magnetization state; programmable NML majority gate; programmable nanomagnet-logic majority gate; quantitative simulation data; supermalloy magnets; Logic gates; Magnetic resonance imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2010
Conference_Location
South Bend, IN
ISSN
1548-3770
Print_ISBN
978-1-4244-6562-0
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2010.5551921
Filename
5551921
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