Title :
Multisine excitation for ACPR measurements
Author_Institution :
RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We use a simulator to compare adjacent-channel power ratio (ACPR) measurements of a nonlinear device excited with various multisine signals to ACPR measurements of the same device excited with pseudorandom digital modulation. We examine four common types of multisine excitation, each with identical numbers of tones, tone-spacings, and nominal power levels, but with different magnitude and phase relationships between tones. We show that use of some common multisines may result in significant overestimation of the actual ACPR from the digitally modulated nonlinear device.
Keywords :
adjacent channel interference; modulation; time-domain analysis; ACPR measurements; adjacent-channel power ratio; magnitude relationships; multisine signals; nominal power levels; nonlinear device; overestimation; phase relationships; pseudorandom digital modulation; tone-spacings; Character generation; Digital modulation; Multiaccess communication; NIST; Peak to average power ratio; Power measurement; Quadrature phase shift keying; RF signals; Radio frequency; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1210586
