DocumentCode
1628390
Title
Reduction of 1/f PM noise in BJT amplifiers with emitter feedback using compensation effects
Author
Boldyreva, Tatiana I.
Author_Institution
Moscow Power Eng. Inst., Russia
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
183
Lastpage
191
Abstract
Investigation of 1/f PM and AM noise in bipolar junction transistor (BJT) amplifiers has shown that there are some opportunities to reduce 1/f PM noise in amplifiers using complex emitter feedback. But there was no systematic investigation of opportunities and limitations of this method of 1/f PM noise reduction. The aim of this paper is to present results of such an investigation. To solve the problem, a more general model of 1/f noise generation in BJT was used. Fluctuations both in recombination conductivity and base charging capacitance are taken into consideration. Two cases of compensation are considered. In the case of "wideband" compensation there is a wide frequency band where the reduction doesn\´t depend on the signal frequency ωs. In the case of "narrowband" compensation there is a deep notch in dependence of 1/f PM noise power spectral density at each fixed Fourier frequency on ωs. Limitations on the highest possible ωs at which compensation effect can be obtained are considered
Keywords
1/f noise; bipolar transistor circuits; capacitance; circuit noise; compensation; equivalent circuits; feedback amplifiers; phase noise; 1/f fluctuations; 1/f noise; AM noise; BJT amplifiers; PM noise; base charging capacitance; circuit model; complex emitter feedback; fixed Fourier frequency; general model; incremental model; mutual conductivity; narrowband compensation; noise power spectral density; recombination conductivity; self-biasing parameter; wideband compensation; Capacitance; Circuit noise; Feedback circuits; Fluctuations; Frequency; Impedance; Low-frequency noise; Noise reduction; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
Conference_Location
Seattle, WA
ISSN
1075-6787
Print_ISBN
0-7803-7028-7
Type
conf
DOI
10.1109/FREQ.2001.956184
Filename
956184
Link To Document