DocumentCode :
1628540
Title :
Device characteristics of single-layer graphene FETs grown on copper
Author :
Tahy, Kristof ; Fleming, Margaret Jane ; Raynal, Barbara ; Protasenko, Vladimir ; Koswatta, Siyuranga ; Jena, Debdeep ; Xing, Huili ; Kelly, Michelle
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear :
2010
Firstpage :
77
Lastpage :
78
Abstract :
The exceptional electrical properties of graphene materials have led to an explosion of research investigating the potential of graphene as the foundation for a future generation of devices as well as developing methods of producing high quality graphene materials. Material quality and our ability to manipulate the properties of graphene will ultimately determine the success of graphene as a device platform. Recently, the formation of single layer graphene via catalyzed-chemical vapor deposition (CVD) on copper foils has generated much interest. A few groups have reported the CVD growth of graphene on copper, and transport properties including quantum Hall effect in layers subsequently transferred to insulating substrates. However, there have been no careful studies of FETs fabricated from them. In this work, we report the characteristics of single-layer graphene FETs whose channels were grown by CVD on copper.
Keywords :
catalysis; chemical vapour deposition; copper; field effect transistors; graphene; quantum Hall effect; semiconductor materials; CVD growth; Cu; catalyzed-chemical vapor deposition; device characteristics; electrical property; graphene material; insulating substrate; material quality; quantum Hall effect; single-layer graphene FET; Copper; FETs; Impurities; Modulation; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2010
Conference_Location :
South Bend, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4244-6562-0
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2010.5551930
Filename :
5551930
Link To Document :
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