Title :
A comparison of monolithic background calibration in two time-interleaved analog-to-digital converters
Author :
Dyer, Kenneth ; Fu, Daihong ; Hurst, Paul ; Lewis, Stephen
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Abstract :
Two background calibration methods for time-interleaved pipelined analog-to-digital converters are described and compared. One approach uses an extra ADC channel and analog calibration circuits; the other uses extra resolution and digital calibration circuits. Both approaches have been integrated in a 1-μm CMOS process. The strengths and weaknesses of the two approaches are presented, and the measured data are compared
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; pipeline processing; 1 micron; ADC channel; CMOS process; analog calibration circuit; digital calibration circuits; measured data; monolithic background calibration; pipelined analog-to-digital converters; resolution; time-interleaved analog-to-digital converters; Analog-digital conversion; Apertures; Bandwidth; Calibration; Digital filters; Digital signal processing; Filtering; Laboratories; Signal resolution; Solid state circuits;
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
DOI :
10.1109/ISCAS.1998.704123
