DocumentCode
1628635
Title
Application of Proportional Difference Operator method on retention characteristics study of Flash Memory
Author
Xie, Bing ; Xu, Mingzhen ; Tan, Changhua
Author_Institution
Dept. of Microelectron., Peking Univ., Beijing, China
fYear
2010
Firstpage
1719
Lastpage
1721
Abstract
The retention characteristics of Flash Memory structures was mainly studied using Proportional Difference Operator (PDO) method in this paper. This method makes it rapid to extract the leakage time constant of charge in floating gate.
Keywords
flash memories; flash memory; floating gate; leakage time constant; proportional difference operator method; retention characteristics; Capacitance; Flash memory cells; Logic gates; Nonvolatile memory; Stress; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667321
Filename
5667321
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