DocumentCode :
1628640
Title :
Design and analysis of a W-Band detector in 0.18-µm SiGe BiCMOS
Author :
Le Zheng ; Gilreath, Leland ; Jain, Vipul ; Heydari, Payam
Author_Institution :
Nanoscale Commun. Integrated Circuits Lab., Univ. of California, Irvine, CA, USA
fYear :
2010
Firstpage :
196
Lastpage :
199
Abstract :
This paper presents the analysis, design and implementation of a millimeter-wave W-band power detector. Fabricated in a 0.18-μm SiGe BiCMOS technology, the detector circuit exhibits a responsivity of 91 kV/W, a noise equivalent power of 0.5 pW/Hz1/2, and a noise figure of 29 dB. The power dissipation of the detector is 75 μW. Reasonable agreement between simulations and measurements is obtained. To the authors´ best knowledge, the detector in this work achieves the highest responsivity reported to date for any solid-state W-band detector.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; MMIC; detector circuits; BiCMOS; detector circuit; millimeter-wave W-band power detector; noise figure 29 dB; power 75 μW; power dissipation; size 0.18 μm; BiCMOS integrated circuits; Dicke switch; W-band; direct-detection; millimeter-wave; passive imaging; power detector; radiometers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2010 Topical Meeting on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-5456-3
Type :
conf
DOI :
10.1109/SMIC.2010.5422987
Filename :
5422987
Link To Document :
بازگشت