Multifrequency introscopy of complex dielectric structures with embedded objects

Author

Alekseev, V.V. ; Andreev, M.V. ; Drobakhin, O.O. ; Kondratyev, Ye.V. ; Saltykov, D. Yu

Author_Institution

Dnepropetrovsk Nat. Univ., Ukraine

Volume

2

fYear

2004

Firstpage

815

Abstract

Description of a microwave introscope combining multifrequency measurements and transversal scanning is presented. Longitudinal distance dependencies of reflectivity are obtained by synthesis from multifrequency data. The multifrequency measurements and synthesis is done in real-time. The apparatus carries out the measurements in free space and is implemented using measuring modules of scalar reflectometer of series P2 (R2). Combination of data in longitudinal and transversal directions produces radio images of dielectric structures with embedded objects. Some results of testing are presented.

Keywords

microwave imaging; microwave reflectometry; nondestructive testing; reflectometers; VSWR indicator device; complex dielectric structures; digitally controlled system; embedded objects; free space; frequency tuning; longitudinal distance dependence; measuring modules; microwave introscope; multifrequency introscopy; nondestructive testing; reflectivity; scalar reflectometer; sweep-generator; transversal scanning; Dielectric measurements; Frequency measurement; Materials testing; Microwave measurements; Nondestructive testing; Probes; Real time systems; Reflectivity; System testing; Tuning;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on

Print_ISBN

0-7803-8411-3

Type

conf

DOI

10.1109/MSMW.2004.1346176

Filename

1346176