Title :
Recent advances in integrated ferroelectric and multiferroic materials
Author_Institution :
ICMCB CNRS, Univ. of Bordeaux, Pessac, France
Abstract :
Ferroelectric materials have very appealing properties such as their dielectric permittivity, piezoelectric coefficients and permanent polarization. Two large scale applications of ferroelectric thin films are already achieved: on-chip large capacitances (MIM) and ferroelectric random access memories (FERAM). The focus is now on the design and reliability of integrated structures. The case of high frequency agile capacitors based on ferroelectric films will be described in details in this respect. Multiferroic materials are under consideration since more than 50 years because of the coexistence and eventually the coupling between polarization and magnetization in a given compound. Since the number of room temperature multiferroics is very restricted at present, several alternative routes including nano-composites or multilayers are under consideration.
Keywords :
MIM devices; ferroelectric materials; ferroelectric storage; ferroelectric thin films; multiferroics; permittivity; piezoelectricity; random-access storage; design; dielectric permittivity; ferroelectric material; ferroelectric random access memories; ferroelectric thin films; high frequency agile capacitors; multiferroic material; on-chip large capacitances; permanent polarization; piezoelectric coefficients; reliability; Dielectric materials; Dielectric thin films; Ferroelectric films; Ferroelectric materials; Large-scale systems; Magnetic materials; Permittivity; Piezoelectric films; Piezoelectric polarization; Random access memory; Thin films; capacitors; multifunctional devices;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2010 Topical Meeting on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-5456-3
DOI :
10.1109/SMIC.2010.5422992