• DocumentCode
    1628755
  • Title

    Recent advances in integrated ferroelectric and multiferroic materials

  • Author

    Maglione, Mario

  • Author_Institution
    ICMCB CNRS, Univ. of Bordeaux, Pessac, France
  • fYear
    2010
  • Firstpage
    216
  • Lastpage
    219
  • Abstract
    Ferroelectric materials have very appealing properties such as their dielectric permittivity, piezoelectric coefficients and permanent polarization. Two large scale applications of ferroelectric thin films are already achieved: on-chip large capacitances (MIM) and ferroelectric random access memories (FERAM). The focus is now on the design and reliability of integrated structures. The case of high frequency agile capacitors based on ferroelectric films will be described in details in this respect. Multiferroic materials are under consideration since more than 50 years because of the coexistence and eventually the coupling between polarization and magnetization in a given compound. Since the number of room temperature multiferroics is very restricted at present, several alternative routes including nano-composites or multilayers are under consideration.
  • Keywords
    MIM devices; ferroelectric materials; ferroelectric storage; ferroelectric thin films; multiferroics; permittivity; piezoelectricity; random-access storage; design; dielectric permittivity; ferroelectric material; ferroelectric random access memories; ferroelectric thin films; high frequency agile capacitors; multiferroic material; on-chip large capacitances; permanent polarization; piezoelectric coefficients; reliability; Dielectric materials; Dielectric thin films; Ferroelectric films; Ferroelectric materials; Large-scale systems; Magnetic materials; Permittivity; Piezoelectric films; Piezoelectric polarization; Random access memory; Thin films; capacitors; multifunctional devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2010 Topical Meeting on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-5456-3
  • Type

    conf

  • DOI
    10.1109/SMIC.2010.5422992
  • Filename
    5422992