Use of near-field microwave microscope for measurement of dielectric constant

Author

Launets, V.L. ; Oliynyk, V.V.

Author_Institution

Nat. Taras Shevchenko Univ. of Kyiv, Ukraine

Volume

2

fYear

2004

Firstpage

818

Abstract

In order to simplify the measurement of permittivity we have worked out a method in which as a measurement device was used the near-field microwave microscope with probe, which has the form of an open-ended coaxial waveguide; what is important is that the probe has salient inner conductor. The coaxial probe is connected with the elements of the microscope by waveguide-coaxial transition. Such a probe construction allows decreasing essentially the accuracy requirements to this experiment.

Keywords

calibration; coaxial waveguides; microscopes; microwave measurement; permittivity measurement; probes; waveguide transitions; calibration; coaxial probe; matching points; near field interaction; near-field microwave microscope; open-ended coaxial waveguide; permittivity measurement; reflection dependence; salient inner conductor; waveguide-coaxial transition; Coaxial components; Conductors; Dielectric constant; Dielectric measurements; Microscopy; Microwave devices; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on

Print_ISBN

0-7803-8411-3

Type

conf

DOI

10.1109/MSMW.2004.1346177

Filename

1346177