DocumentCode
1628855
Title
Comparative analysis of the performance of InAs lateral and vertical band-to-band tunneling transistors
Author
Ganapathi, Kartik ; Yoon, Youngki ; Salahuddin, Sayeef
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
fYear
2010
Firstpage
57
Lastpage
58
Abstract
This paper proposes two major classes of band-to-band tunneling devices: one with an ultra thin body double gate geometry where the tunneling is completely along the transport direction and the other, where tunneling is expected to be vertical by having a pocket (halo) in the gate-to-source overlap region. In both cases it uses InAs as the channel material. The vertical tunneling structure provides more ON current due to the dual contribution of vertical and lateral tunneling and the OFF current is determined by the same physics.
Keywords
III-V semiconductors; field effect transistors; indium compounds; tunnelling; InAs; OFF current; ON current; band-to-band tunneling field effect transistors; channel material; double gate geometry; gate-to-source overlap region; vertical tunneling structure; Geometry; Logic gates; Photonic band gap; Quantum capacitance; Semiconductor process modeling; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2010
Conference_Location
South Bend, IN
ISSN
1548-3770
Print_ISBN
978-1-4244-6562-0
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2010.5551943
Filename
5551943
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