• DocumentCode
    1628855
  • Title

    Comparative analysis of the performance of InAs lateral and vertical band-to-band tunneling transistors

  • Author

    Ganapathi, Kartik ; Yoon, Youngki ; Salahuddin, Sayeef

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
  • fYear
    2010
  • Firstpage
    57
  • Lastpage
    58
  • Abstract
    This paper proposes two major classes of band-to-band tunneling devices: one with an ultra thin body double gate geometry where the tunneling is completely along the transport direction and the other, where tunneling is expected to be vertical by having a pocket (halo) in the gate-to-source overlap region. In both cases it uses InAs as the channel material. The vertical tunneling structure provides more ON current due to the dual contribution of vertical and lateral tunneling and the OFF current is determined by the same physics.
  • Keywords
    III-V semiconductors; field effect transistors; indium compounds; tunnelling; InAs; OFF current; ON current; band-to-band tunneling field effect transistors; channel material; double gate geometry; gate-to-source overlap region; vertical tunneling structure; Geometry; Logic gates; Photonic band gap; Quantum capacitance; Semiconductor process modeling; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2010
  • Conference_Location
    South Bend, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-6562-0
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2010.5551943
  • Filename
    5551943