DocumentCode :
1628855
Title :
Comparative analysis of the performance of InAs lateral and vertical band-to-band tunneling transistors
Author :
Ganapathi, Kartik ; Yoon, Youngki ; Salahuddin, Sayeef
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
fYear :
2010
Firstpage :
57
Lastpage :
58
Abstract :
This paper proposes two major classes of band-to-band tunneling devices: one with an ultra thin body double gate geometry where the tunneling is completely along the transport direction and the other, where tunneling is expected to be vertical by having a pocket (halo) in the gate-to-source overlap region. In both cases it uses InAs as the channel material. The vertical tunneling structure provides more ON current due to the dual contribution of vertical and lateral tunneling and the OFF current is determined by the same physics.
Keywords :
III-V semiconductors; field effect transistors; indium compounds; tunnelling; InAs; OFF current; ON current; band-to-band tunneling field effect transistors; channel material; double gate geometry; gate-to-source overlap region; vertical tunneling structure; Geometry; Logic gates; Photonic band gap; Quantum capacitance; Semiconductor process modeling; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2010
Conference_Location :
South Bend, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4244-6562-0
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2010.5551943
Filename :
5551943
Link To Document :
بازگشت