Elimination of radiation induced frequency-shifts caused by migration of alkali-metal ions in quartz

Author

Halperin, Abraham

Author_Institution

Hebrew Univ. of Jerusalem, Israel

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

311

Lastpage

315

Abstract

Quartz usually contains AI impurities substituted for silicon in the lattice, with monovalent ions, as charge compensators at the Al. Ionizing radiation was found to induce frequency shifts in quartz resonators, caused by the migration in the lattice of the monovalent ions. Thermoluminescence was used in the present work to investigate the migration of the monovalent ions, Li⁺ in the present work. The investigation suggested a way to transfer the Li ions from the Al to sites where they form thermally stable electron traps. They are then not available for migration in the lattice. Irradiation at 350 K was found to reduce the concentration of the Li ions available for migration by two orders of magnitude

Keywords

X-ray effects; charge compensation; crystal resonators; diffusion; electron traps; piezoelectric materials; quartz; thermoluminescence; 350 K; SiO₂:Li; X-irradiation; alkali metal ion migration; charge compensators; free electrons; frequency offsets; ionizing radiation effect; low temperature glow curve; monovalent ion migration; quartz resonators; radiation induced frequency-shifts; thermally stable electron traps; thermoluminescence; Artificial intelligence; Copper; Crystals; Electron traps; Frequency; Heating; Ionizing radiation; Lattices; Optical resonators; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International

Conference_Location

Seattle, WA

ISSN

1075-6787

Print_ISBN

0-7803-7028-7

Type

conf

DOI

10.1109/FREQ.2001.956208

Filename

956208