A digitally reconfigurable auto amplitude calibration method for wide tuning range VCO design

Author

Zhang, Zhuo ; Li, Jun ; Sun, Yuanfeng ; Rhee, Woogeun ; Wang, ZhiHua

Author_Institution

Inst. of Microelectron., Tsinghua Univ., Beijing, China

fYear

2010

Firstpage

542

Lastpage

544

Abstract

A wide tuning range LC VCO with auto amplitude control is designed in 0.13-μm CMOS. Phase noise optimized design for the wide tuning range VCO is discussed and a PVT insensitive digitally reconfigurable auto amplitude calibration (AAC) circuit is used to stabilize the phase noise in the whole wide band. The proposed AAC circuit with a code estimated FSM provides faster operation to get the optimum state than the conventional one. Transistor-level simulations show that the proposed AAC method improves phase noise performance by more than 10dB..

Keywords

CMOS integrated circuits; calibration; circuit tuning; phase noise; voltage-controlled oscillators; AAC circuit; CMOS; PVT insensitive digitally reconfigurable auto amplitude calibration circuit; automatic amplitude control; code estimated FSM; digitally reconfigurable auto amplitude calibration method; phase noise optimized design; size 0.13 mum; wide tuning range LC VCO; wide tuning range VCO design; Calibration; Equations; Mathematical model; Phase noise; Tuning; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on

Conference_Location

Shanghai

Print_ISBN

978-1-4244-5797-7

Type

conf

DOI

10.1109/ICSICT.2010.5667344

Filename

5667344