Title :
Reliability study of 1.55-μm DBR lasers grown in three MOVPE steps
Author :
Delorme, F. ; Alibert, G.
Author_Institution :
France Telecom, CNET, Bagneux
Abstract :
Broadly tunable high-speed light sources are very attractive for high capacity wavelength-division multiplexing (WDM) transmission and photonic-switching systems. The wavelength tunable distributed Bragg reflector (DBR) is a promising device for these applications. However, for system applications, the reliability of tunable devices must be very high: in particular, each accessible wavelength must be selected by a current staying stable hours after hours. A serious doubt has recently been cast on the DBR laser aging behavior. Based on an accelerated aging study performed on DBR lasers, exhibiting relatively poor characteristics, this previous work demonstrates that the tuning section degrades more rapidly than the active section
Keywords :
ageing; distributed Bragg reflector lasers; infrared sources; laser reliability; laser transitions; laser tuning; optical fabrication; optical testing; semiconductor device reliability; semiconductor device testing; semiconductor growth; semiconductor lasers; telecommunication network reliability; vapour phase epitaxial growth; wavelength division multiplexing; 1.55 mum; DBR laser aging behavior; DBR lasers; WDM; accelerated aging study; active section; broadly tunable high-speed light sources; high capacity wavelength-division multiplexing; laser tuning section degradation; photonic-switching systems; semiconductor laser reliability tests; three MOVPE steps; tunable devices; tuning section; wavelength tunable distributed Bragg reflector; Epitaxial growth; Epitaxial layers; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Fiber lasers; Laser excitation; Optical fiber communication; Optical fibers; Pump lasers; Underwater vehicles;
Conference_Titel :
Optical Fiber Communication. OFC 97., Conference on
Conference_Location :
Dallas, TX
Print_ISBN :
1-55752-480-7
DOI :
10.1109/OFC.1997.719956
