DocumentCode
1629398
Title
Quantum transport and electron-phonon interaction in nanoscale MOSFETs
Author
Mori, Nobuya ; Minari, Hideki ; Mil´nikov, Genaddy ; Kamakura, Yoshinari
Author_Institution
Grad. Sch. of Eng., Osaka Univ., Suita, Japan
fYear
2010
Firstpage
1757
Lastpage
1760
Abstract
Quantum-transport simulations of current-voltage characteristics are performed in nanoscale metal-oxide-semiconductor field-effect-transistors. Effects of interface roughness, discrete impurity, and phonon scattering are studied. Band-structure effects in p-type nanowire transistors are also investigated.
Keywords
MOSFET; ballistic transport; electron-phonon interactions; nanoelectronics; nanowires; discrete impurity; electron-phonon interaction; interface roughness; nanoscale MOSFET; phonon scattering; quantum transport; Logic gates; MOSFETs; Nanoscale devices; Phonons; Scattering; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667351
Filename
5667351
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