Highly reliable performance of 980-nm pump lasers predicted by optical over-stress life tests

Author

Arakida, Takahiro ; Chida, Hiroaki ; Fukagai, Kazuo ; Miyazaki, Takashi ; Ishikawa, Seiichiro

Author_Institution

Opto-Electron. Res. Lab., NEC Corp., Tsukuba, Japan

fYear

1997

Firstpage

353

Lastpage

354

Abstract

In conclusion, the time to catastrophic optical damage (COD) failures of 980-nm pump InGaAs strained double quantum well lasers was estimated by using accelerated aging tests of over 200 mW. The laser passivated with the SiN_x-Al₂O₃ combined films has a lifetime of over 130,000 h at a 90-mW fiber-coupled power level, which is suitable for applications to practical EDFA systems

Keywords

III-V semiconductors; ageing; gallium arsenide; indium compounds; infrared sources; laser reliability; laser transitions; life testing; optical films; optical testing; optical transmitters; quantum well lasers; semiconductor device reliability; semiconductor device testing; 200 mW; 90 mW; 980 nm; IR lasers; InGaAs; InGaAs strained double quantum well lasers; SiN-Al₂O₃; SiN_x-Al₂O₃ combined films; accelerated aging tests; catastrophic optical damage failures; fiber-coupled power level; highly reliable performance; laser transitions; nm pump lasers; optical over-stress life tests; passivated; practical EDFA systems; time to COD failures; Accelerated aging; Fiber lasers; Indium gallium arsenide; Laser excitation; Optical films; Optical pumping; Power lasers; Pump lasers; Quantum well lasers; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Optical Fiber Communication. OFC 97., Conference on

Conference_Location

Dallas, TX

Print_ISBN

1-55752-480-7

Type

conf

DOI

10.1109/OFC.1997.719958

Filename

719958