DocumentCode
1629444
Title
Influence of system transients on the residual flux of an unloaded transformer
Author
Corrodi, Y. ; Kamei, K. ; Kohyama, H. ; Ito, H. ; Goda, T.
Author_Institution
R&D, Mitsubishi Electr., Amagasaki, Japan
fYear
2011
Firstpage
1
Lastpage
7
Abstract
Developments of smart grids and integration of renewable energy sources will increase the amount of switching operations of unloaded transformer systems. A random energization of an unloaded power transformer can cause inrush currents and related voltage disturbances. State of the art controller systems control these phenomena taking into account the residual flux after a transformer de-energization, which is generally assumed as a stable and “locked in” value. However, the residual flux can be influenced by system transients passing through a circuit breaker´s grading capacitors. Furthermore, the frequency content of system transients can also change the transformer impedance at the instant while the system transients appear. These changes determine how extent system transients influence the residual flux and therefore change the optimal re-energization instant. The paper evaluates these phenomena based on frequency response analysis and proposes a filter for an improved approximation of the residual flux level.
Keywords
circuit breakers; frequency response; power transformers; transient analysis; circuit breaker grading capacitors; frequency response analysis; inrush currents; locked in value; renewable energy source integration; residual flux level; smart grids; switching operations; system transient frequency content; transformer deenergization; transformer impedance; unloaded power transformer systems; voltage disturbances; Frequency measurement; Power transformers; Surges; Transformer cores; Transient analysis; Voltage measurement; Windings; Controlled Switching; Frequency Response; Inrush Currents; Residual Flux; Transformer; Transients;
fLanguage
English
Publisher
ieee
Conference_Titel
Power and Energy Society General Meeting, 2011 IEEE
Conference_Location
San Diego, CA
ISSN
1944-9925
Print_ISBN
978-1-4577-1000-1
Electronic_ISBN
1944-9925
Type
conf
DOI
10.1109/PES.2011.6039530
Filename
6039530
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