Title :
A PCA/MDA scheme for hand posture recognition
Author :
Deng, Jiangwen ; Tsui, H.T.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
Abstract :
Principal component analysis (PCA) and multiple discriminant analysis (MDA) have long been used for appearance-based hand posture recognition. In this paper, we propose a novel PCA/MDA scheme for hand posture recognition. The scheme is represented by two layers of nodes (classes). The first layer of nodes acts as a crude classification using PCA, and each input pattern is given a likelihood of being in the nodes of this layer. Then MDA is applied locally to the postures in each node of the first layer to give a precise classification of the postures. Each precise class is a node in the second layer. For training, unsupervised classification at the first layer can be obtained using expectation maximization (EM). For better training results, a feedback from each node in the second layer is introduced in the EM process. The experiments on a 100-sign vocabulary show a significant improvement from 57.0% to 63.5%, compared with the global MDA. If combined with a hidden Markov model (HMM) for movement modeling, about a 93.5% recognition rate is achieved for test data.
Keywords :
feedback; gesture recognition; handicapped aids; hidden Markov models; image classification; optimisation; principal component analysis; unsupervised learning; vocabulary; appearance-based hand posture recognition; expectation maximization; feedback; hidden Markov model; movement modeling; multiple discriminant analysis; node layers; pattern classification; posture classification; principal component analysis; recognition rate; sign language; sign vocabulary; training; unsupervised classification; Feedback; Hidden Markov models; Image segmentation; Joints; Linear discriminant analysis; Principal component analysis; Scattering; Shape; Testing; Vocabulary;
Conference_Titel :
Automatic Face and Gesture Recognition, 2002. Proceedings. Fifth IEEE International Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7695-1602-5
DOI :
10.1109/AFGR.2002.1004169