Title :
A Hemt Lsi For A Multibit Data Register
Author :
Watanabe, Y. ; Saito, S. ; Kobayashi, N. ; Suzuki, M. ; Yokoyama, T. ; Mitani, E. ; Odani, K. ; Mimura, T. ; Abe, M.
Author_Institution :
Fujitsu Laborarories Ltd., Atsugi, Japan
Keywords :
Clocks; Delay effects; Electron beams; HEMTs; Large scale integration; Lithography; Logic circuits; Registers; Semiconductor device measurement; Synchronization;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663649
