Title :
Noise Phenomena in HgCdTe Photodiodes
Author :
Rosenfeld, D. ; Nemirovsky, Y.
Author_Institution :
Department of Electrical Engineering, Technion - Israel Institute of Technology
Keywords :
Dark current; Density measurement; Diodes; Electrical resistance measurement; Frequency measurement; Noise measurement; Photodiodes; Tunneling; Voltage; Zinc compounds;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
DOI :
10.1109/EEIS.1989.720009
