DocumentCode :
1629980
Title :
Test Technology Technical Council (TTTC)
fYear :
2006
Abstract :
Provides a listing of current committee members and society officers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2514-8
Type :
conf
DOI :
10.1109/VTS.2006.86
Filename :
1617551
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1629980
