• DocumentCode
    1630151
  • Title

    Aitest: A Real Life Expert System for Electronic Troublshooting and Test Management

  • Author

    Ben-Bassat, Moshe ; Ben-Arie, Daphna ; Ben-Zvi, Inna ; Binyamini, Israel ; Cheifetz, Jonathan ; Sela, Mordechai ; Shalev, Michal

  • Author_Institution
    Tel Aviv University, Israel
  • fYear
    1989
  • Firstpage
    1
  • Lastpage
    4
  • Keywords
    Costs; Design engineering; Electronic equipment testing; Engineering management; Expert systems; Fault diagnosis; Large-scale systems; Libraries; Life testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
  • Type

    conf

  • DOI
    10.1109/EEIS.1989.720018
  • Filename
    720018