DocumentCode
1630590
Title
Area optimization algorithm for body-bias based on input vector control
Author
Zhaoshan, Sun ; Kun, Huang ; Zuying, Luo
Author_Institution
Coll. of Inf. Sci. & Technol., Beijing Normal Univ., Beijing, China
fYear
2010
Firstpage
737
Lastpage
739
Abstract
With the technology scaling down to the deep sub-micron domain, leakage power increases rapidly in VLSI, enhancing the area overhead of dynamic power management system. Reverse Body Bias(RBB) is a common method to reduce the leakage power at run-time. To overcome the larger area overhead of controller applied on RBB, this paper proposes a new way of connection, which can reduce area of controller substantially. Based on dual-threshold voltage CMOS designs, when the input vector is the minimum leakage pattern, this paper applies VRBB to the low threshold voltage (LVT) and Dominate Leakage State (DLS) MOS transistors. Experimental results is based on a set of ISCAS85 benchmark circuits in a Predictive 22 nm process, comparing with previous works, this algorithm can reduce 84.91% area overhead with the cost of 27.94% leakage current penalty.
Keywords
CMOS integrated circuits; MOSFET; VLSI; leakage currents; ISCAS85 benchmark circuits; VLSI; area optimization algorithm; dominate leakage state MOS transistors; dual-threshold voltage CMOS designs; dynamic power management system; input vector control; leakage current; low threshold voltage MOS transistors; minimum leakage pattern; reverse body bias; Capacitance; Control systems; Logic gates; Optimization; Substrates; Threshold voltage; Transistors; Input vector control; Leakage power; Substrate bias;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667397
Filename
5667397
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