Title : 
Early, accurate and fast yield estimation through Monte Carlo-alternative probabilistic behavioral analog system simulations
         
        
            Author : 
Topaloglu, Rasit Onur
         
        
            Author_Institution : 
Dept. of Comput. Sci. & Eng., California Univ., La Jolla, CA
         
        
        
        
            Abstract : 
Monte Carlo analysis has so far been the corner stone for analog statistical simulations. Fast and accurate simulations are necessary for stringent time-to-market, design for manufacturability and yield concerns in the analog domain. Although Monte Carlo attains accuracy, it does so with a sacrifice in run-time for analog simulations. In this paper, we propose a fast and accurate probabilistic simulation method alternative to Monte Carlo using deterministic sampling and weight propagation. We furthermore propose accuracy improvement algorithms and a fast yield calculation method. The proposed method shows accuracy improvement combined with a 100-fold reduction in run-time with respect to a 1000-sample Monte Carlo analysis
         
        
            Keywords : 
Monte Carlo methods; analogue simulation; estimation theory; Monte Carlo analysis; accurate probabilistic simulation; accurate yield estimation; analog statistical simulations; behavioral analog system; deterministic sampling; early yield estimation; fast yield estimation; probabilistic analog system; weight propagation; Analytical models; Circuit simulation; Computational modeling; Computer simulation; Monte Carlo methods; Principal component analysis; Runtime; Sampling methods; Sensitivity analysis; Yield estimation;
         
        
        
        
            Conference_Titel : 
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
         
        
            Conference_Location : 
Berkeley, CA
         
        
            Print_ISBN : 
0-7695-2514-8
         
        
        
            DOI : 
10.1109/VTS.2006.30