Title :
RF front-end system gain and linearity built-in test
Author :
Wang, Qi ; Soma, Mani
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA
Abstract :
This work addresses the concurrent on-chip measurement of the gain, the input 1-dB compression point (ICP1-dB), and the input-referred third-order interference point (IIP3) of individual RF building blocks in RF front-end systems, using introduced high speed CMOS RF on-chip amplitude detectors, which work up to 20 GHz with high accuracy, small area, and low power consumption
Keywords :
CMOS integrated circuits; built-in self test; gain measurement; high-speed integrated circuits; CMOS amplitude detectors; RF amplitude detectors; RF building blocks; RF front-end system; built-in test; concurrent on-chip measurement; gain measurement; high speed amplitude detectors; input-referred interference point; linearity measurement; on-chip amplitude detectors; third-order interference point; Area measurement; Built-in self-test; Detectors; Gain measurement; Linearity; Power measurement; Radio frequency; Radiofrequency interference; System-on-a-chip; Velocity measurement; CMOS RF amplitude; RF test; built-in test; detector; gfain measurement; linearity measurement;
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2514-8
DOI :
10.1109/VTS.2006.59
