Title :
Modular compactor of test responses
Author :
Rajski, Wojciech ; Rajski, Janusz
Author_Institution :
Oregon State Univ., Corvallis, OR, USA
Abstract :
This paper describes a new time compactor built of multiple-input circular registers of relatively prime length. It has excellent ability to detect errors corresponding to real defects such as errors of small multiplicity and burst errors. It operates in modular arithmetic and uses the Chinese remaindering to diagnose scan errors. Given that circular registers do not multiply errors or X values, the compactor is X tolerant.
Keywords :
automatic test equipment; built-in self test; error detection; X tolerant; X values; burst errors; modular compactor; multiple-input circular registers; real defects; scan errors diagnosis; small multiplicity; test responses; time compactor built; Arithmetic; Built-in self-test; Circuit testing; Compaction; Feedback; Flip-flops; Graphics; Logic testing; Polynomials; Shift registers;
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN :
0-7695-2514-8
DOI :
10.1109/VTS.2006.48
