Title :
Efficient fault collapsing via generalized dominance relations
Author :
Vimjam, Vishnu C. ; Hsiao, Michael S.
Author_Institution :
Dept. of ECE, Virginia Tech, Blacksburg, VA
Abstract :
Fault collapsing of a fault-set helps in obtaining smaller test-sets as well as in reducing fault-simulation times. In this paper, we propose two new theorems by making use of the generalized dominance relations exhibited by a pair of faults. In order to learn several unique requirements for the faults in a low-cost manner, we employ a fault-independent analysis and propose heuristics to reduce the number of fault-pair comparisons required. Experimental results on ISCAS85, 89 & 93 benchmarks show that significantly more faults can be collapsed as compared to the existing methods, with smaller run-times in many cases. For most circuits, collapsing to less than 30% of the total number of faults is achieved
Keywords :
automatic test pattern generation; benchmark testing; fault simulation; ISCAS85 benchmarks; ISCAS89 benchmarks; ISCAS93 benchmarks; efficient fault collapsing; fault-independent analysis; fault-pair comparisons; fault-set; fault-simulation time reduction; generalized dominance relations; propose heuristics; smaller test-sets; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Fault diagnosis; Libraries; Packaging; Runtime;
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2514-8
DOI :
10.1109/VTS.2006.31
