Title :
Universal at-speed test fixturing for high-pin-count ICs
Author_Institution :
VLSI Technol. Inc., Tempe, AZ, USA
Abstract :
This paper details design guidelines and implementation of a universal load-board system to support high-pin-count ASIC designs. ASICs needing multiple supplies can also be supported. High-speed AC measurements are also possible without the use of expensive custom load-board systems.
Keywords :
application specific integrated circuits; integrated circuit measurement; integrated circuit testing; production testing; ASICs; IC testing; at-speed test fixturing; design guidelines; high-pin-count ICs; high-speed AC measurements; multiple supplies; product fixturing; test environment; universal load-board system; Application specific integrated circuits; Fixtures; Integrated circuit testing; Manufacturing; Packaging; Power distribution; Power supplies; Proposals; Relays; Switches;
Conference_Titel :
Southcon/94. Conference Record
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-9988-9
DOI :
10.1109/SOUTHC.1994.498152
