DocumentCode :
1631512
Title :
Session Abstract
Author :
Kee Sup Kim ; Tehranipoor, Mohammad
Author_Institution :
Intel
fYear :
2006
Firstpage :
292
Lastpage :
293
Abstract :
In the course of practicing DFT and test engineering, we make a number of engineering decisions since full set of data are not available. In academia, researchers search for the next big problem and struggle to get access to the real data. What are these missing data and what effects would they have if they were known?
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN :
0-7695-2514-8
Type :
conf
DOI :
10.1109/VTS.2006.66
Filename :
1617606
Link To Document :
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