• DocumentCode
    1631557
  • Title

    Cost impacts of automatic test equipment purchase decisions

  • Author

    Pabst, J. Stephen

  • Author_Institution
    LTX/Trillium, San Jose, CA, USA
  • fYear
    1989
  • Firstpage
    605
  • Lastpage
    610
  • Abstract
    Because modern semiconductor test equipment may cost millions of dollars per unit, the common perception is that test equipment costs are a major portion of the cost of a semiconductor device shipped. Using a computer model which identifies many of the cost components in the production of semiconductor devices, the author shows that test equipment costs are a very small percentage of the total cost of a device. He examines the cost of production per device, using many identifiable costs and including them in the model. More important, the costs incurred before a device arrives at the test site are included in the calculations. Other costs, such as labor overhead, and associated capital costs, are also included. The author shows that the performance of the test equipment has a much larger financial impact than the cost of the equipment
  • Keywords
    automatic test equipment; automatic testing; economics; electronic engineering computing; production testing; semiconductor device testing; automatic test equipment; computer model; costs; production testing; semiconductor test equipment; Automatic test equipment; Costs; Magnetic heads; Packaging; Processor scheduling; Production; Semiconductor device modeling; Semiconductor devices; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82347
  • Filename
    82347