Title :
Investigating the efficiency of integrator-based capacitor array testing techniques
Author :
Durbha, Sai Raghuram ; Laknaur, Amit ; Wang, Haibo
Author_Institution :
Southern Illinois Univ., Carbondale, IL, USA
Abstract :
This paper presents techniques to model the impact of parametric faults on the performance of programmable capacitor arrays (PCAs). Closed-form equations are derived for estimating ranges of parametric faults that can be detected by integrator-based PCA testing circuits. Methods to improve PCA testing efficiency are discussed and experimental results are reported.
Keywords :
capacitors; electron device testing; integrating circuits; capacitor array testing; parametric faults; programmable capacitor arrays; Built-in self-test; Capacitors; Circuit faults; Circuit testing; Electrical fault detection; Electronic equipment testing; Fault detection; Field programmable analog arrays; Principal component analysis; Switches;
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN :
0-7695-2514-8
DOI :
10.1109/VTS.2006.42
