DocumentCode :
1631684
Title :
Session Abstract
Author :
Zorian, Y. ; Kim, Bumki
Author_Institution :
Virage Logic
fYear :
2006
Firstpage :
334
Lastpage :
335
Abstract :
Today’s system-in-package (SiP) technology involves the system integration of multiple die from various technologies into a common package. This session will present SiP applications and their design and test practices from the major SiP companies. The presentations include issues for SiP, and trade-offs between SiP vs. POP vs. SOC integration for cell phone applications.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN :
0-7695-2514-8
Type :
conf
DOI :
10.1109/VTS.2006.65
Filename :
1617613
Link To Document :
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