• DocumentCode
    1631880
  • Title

    Dominance based analysis for large volume production fail diagnosis

  • Author

    Seshadri, B. ; Pomeranz, I. ; Venkataraman, S. ; Amyeen, M.E. ; Reddy, S.M.

  • Author_Institution
    Purdue Univ., West Lafayette, IN
  • fYear
    2006
  • Lastpage
    399
  • Abstract
    A procedure for using fault dominance in a large volume diagnosis environment is described. Fault dominance is shown to be useful for reducing the fault simulation time during diagnosis when used together with the concept of pattern dependence and maximally dominating faults. Results for both ISCAS benchmarks and industrial circuits are reported. The results show 9 % to 44% average reduction in the fault simulation time for these circuits
  • Keywords
    digital circuits; fault simulation; ISCAS benchmarks; fault dominance; fault simulation; production fail diagnosis; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Failure analysis; Fault detection; Fault diagnosis; Logic testing; Production systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2006. Proceedings. 24th IEEE
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7695-2514-8
  • Type

    conf

  • DOI
    10.1109/VTS.2006.29
  • Filename
    1617623