Title :
Dominance based analysis for large volume production fail diagnosis
Author :
Seshadri, B. ; Pomeranz, I. ; Venkataraman, S. ; Amyeen, M.E. ; Reddy, S.M.
Author_Institution :
Purdue Univ., West Lafayette, IN
Abstract :
A procedure for using fault dominance in a large volume diagnosis environment is described. Fault dominance is shown to be useful for reducing the fault simulation time during diagnosis when used together with the concept of pattern dependence and maximally dominating faults. Results for both ISCAS benchmarks and industrial circuits are reported. The results show 9 % to 44% average reduction in the fault simulation time for these circuits
Keywords :
digital circuits; fault simulation; ISCAS benchmarks; fault dominance; fault simulation; production fail diagnosis; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Failure analysis; Fault detection; Fault diagnosis; Logic testing; Production systems; System testing;
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2514-8
DOI :
10.1109/VTS.2006.29
