• DocumentCode
    1632000
  • Title

    Application of error analysis in the evaluation of electron beam potentials from the ratio of filtered X-ray detectors

  • Author

    Rauch, J.E.

  • Author_Institution
    Maxwell Technol. Inc., San Diego, CA, USA
  • Volume
    2
  • fYear
    1999
  • Firstpage
    612
  • Abstract
    Statistical analysis was applied to a set of filtered X-ray detectors to determine the most probable electron beam potential using the estimated variance of each measured ratio. Although this technique was used for potential measurements at both the Defense Threat Reduction Agency ACE 4 accelerator located at Maxwell Technologies and the NRL HAWK accelerator in Washington, DC, only the HAWK data are shown to illustrate the procedure. A weighting factor for each potential measurement was obtained by combining the estimates of the variances for each X-ray signal measurement used to obtain the ratio. The variance in the measured ratio was weighted by the rate of change of the potential with the specific ratio to make the weighting factor applicable to the potential measurement. The electron beam potential waveform measured by this ratio procedure was compared with the electrical probe measurements of the HAWK beam potential.
  • Keywords
    X-ray apparatus; X-ray detection; X-ray production; electron accelerators; electron beams; error analysis; particle beam diagnostics; statistical analysis; voltage measurement; ACE 4 accelerator; Defense Threat Reduction Agency; NRL HAWK accelerator; X-ray signal measurement; electron beam potential waveform; electron beam potentials evaluation; error analysis; filtered X-ray detectors; potential measurement; ratio procedure; statistical analysis; weighting factor; Accelerated aging; Copper; Electric variables measurement; Electron beams; Error analysis; Filters; Statistical analysis; Thickness measurement; Weight measurement; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5498-2
  • Type

    conf

  • DOI
    10.1109/PPC.1999.823586
  • Filename
    823586