DocumentCode
1632029
Title
Author index
fYear
2006
Firstpage
427
Lastpage
428
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location
Berkeley, CA
Print_ISBN
0-7695-2514-8
Type
conf
DOI
10.1109/VTS.2006.20
Filename
1617631
Link To Document