• DocumentCode
    1632049
  • Title

    A prototype optical voltage sensor for accelerator diagnostic applications

  • Author

    Brubaker, M.A. ; Yakymyshyn, C.P. ; Iverson, A.J. ; Vande Veegaete, I.E.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    2
  • fYear
    1999
  • Firstpage
    619
  • Abstract
    A bulk electro-optic Pockels cell has been designed and tested for noninvasive monitoring of an electron beam or high-voltage conductor. This sensor directly measures the signal of interest rather than the time derivative and is thus attractive for long-pulse applications in the microsecond regime with slow rise times. Additional advantages include a fast response time in the order of 10 ns, low cost and complete galvanic isolation via optical fiber coupling between the sensor and electronics. The Pockels cell modulates the intensity of incident laser light as a function of voltage induced on a discrete electrode which is capacitively coupled to the high-voltage source. Details of the sensor design are presented along with preliminary measurements of a high-current electron beam using a BGO Pockels cell and 850 nm laser diode source.
  • Keywords
    Pockels effect; electro-optical devices; electron accelerators; electron beams; fibre optic sensors; pulsed power technology; solid scintillation detectors; voltage measurement; 850 nm; BGO Pockels cell; DARHT II accelerator; accelerator diagnostic applications; discrete electrode; electro-optic Pockels cell; electron beam monitoring; fast response time; galvanic isolation; high-current electron beam; high-voltage conductor; incident laser light intensity modulation; laser diode source; long-pulse applications; noninvasive monitoring; optical fiber coupling; optical voltage sensor; sensor design; Conductors; Electron beams; Electron optics; Monitoring; Optical coupling; Optical sensors; Prototypes; Testing; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5498-2
  • Type

    conf

  • DOI
    10.1109/PPC.1999.823588
  • Filename
    823588