• DocumentCode
    1632087
  • Title

    Radiation Efficiency of Argon Plasma Arc Near 200A

  • Author

    Okubo, M. ; Iwao, T. ; Yumoto, M.

  • Author_Institution
    Musashi Inst. of Technol., Tokyo
  • fYear
    2007
  • Firstpage
    889
  • Lastpage
    889
  • Abstract
    Summary form only given. The radiation power has been applied to various fields such as ultraviolet ray sterilization and large-scale lightings, recently. The plasma arc technology has the feature of high temperature, high luminance, and high energy. The radiation power and wavelength depend on the pressure, current, atmosphere and wavelength. In this paper, the temperature distribution, the radiation power and radiation efficiency emitted from argon plasma arc was calculated. The calculation condition was 1,000-30,000 K with 0.1 MPa and 100-500 A. As a result, the radiation power has increased with increasing the current. The all, UV, VR and IR radiation power was proportional to the 1.45th, 1.53th, 1.50th and 1.33th power of the current. Moreover, the radiation efficiency has increased with increasing the current. The peak radiation efficiency of all, UV and VR became 22.5%, 5.52% and 10.2% at 500 A and it was proportional to the 0.37th, 0.46th and 0.41th power of the current, respectively. The peak radiation efficiency of IR became 6.93% at 400 A and it was proportional to the 0.24th power of the current. The relation between the radiation power and the radiation efficiency became the most efficient at 200 A.
  • Keywords
    arcs (electric); argon; Ar; argon plasma arc; current 100 A to 500 A; large-scale lightings; pressure 0.1 MPa; radiation efficiency; radiation power; temperature 1000 K to 30000 K; temperature distribution; ultraviolet ray sterilization; Argon; Atmosphere; Large-scale systems; Near-field radiation pattern; Plasma temperature; Plasma waves; Power engineering and energy; Temperature distribution; Virtual reality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4346195
  • Filename
    4346195