DocumentCode
1632216
Title
FXR fast beam imaging diagnostics
Author
Ong, M. ; Ferriera, T. ; Gilliam, R. ; Zentler, J. ; Wargo, P.
Author_Institution
Lawrence Livermore Nat. Lab., CA, USA
Volume
2
fYear
1999
Firstpage
636
Abstract
The Lawrence Livermore National Laboratory flash X-ray (FXR) machine is being upgraded to produce two pulses. A very fast imaging system has been developed to characterize the electron beam diameter and shape. The system consists of a kapton target insertion mechanism and a framing camera. It has a fast gated imaging tube (500 ps) and CCD subsystem to capture and send the image to the control room. The beam diameter data provides insight on mechanisms that effect the X-ray spot size. These colorful beam measurements are compared with the authors´ other diagnostics to form a more complete picture of beam behavior. A demonstration is described where the image data was used to design a collimator to improve X-ray beam performance.
Keywords
X-ray apparatus; X-ray production; electron beams; imaging; linear accelerators; particle beam diagnostics; pulsed power technology; 500 ps; CCD subsystem; X-ray beam performance; X-ray spot size; beam diameter data; collimator design; colorful beam measurements; electron beam diameter; electron beam shape; fast beam imaging diagnostics; fast gated imaging tube; flash X-ray machine; framing camera; kapton target insertion mechanism; pulse generation; Cameras; Colliding beam accelerators; Diagnostic radiography; Electron accelerators; Electron beams; Laboratories; Linear accelerators; Optical imaging; Particle accelerators; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-5498-2
Type
conf
DOI
10.1109/PPC.1999.823592
Filename
823592
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