• DocumentCode
    1632216
  • Title

    FXR fast beam imaging diagnostics

  • Author

    Ong, M. ; Ferriera, T. ; Gilliam, R. ; Zentler, J. ; Wargo, P.

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • Volume
    2
  • fYear
    1999
  • Firstpage
    636
  • Abstract
    The Lawrence Livermore National Laboratory flash X-ray (FXR) machine is being upgraded to produce two pulses. A very fast imaging system has been developed to characterize the electron beam diameter and shape. The system consists of a kapton target insertion mechanism and a framing camera. It has a fast gated imaging tube (500 ps) and CCD subsystem to capture and send the image to the control room. The beam diameter data provides insight on mechanisms that effect the X-ray spot size. These colorful beam measurements are compared with the authors´ other diagnostics to form a more complete picture of beam behavior. A demonstration is described where the image data was used to design a collimator to improve X-ray beam performance.
  • Keywords
    X-ray apparatus; X-ray production; electron beams; imaging; linear accelerators; particle beam diagnostics; pulsed power technology; 500 ps; CCD subsystem; X-ray beam performance; X-ray spot size; beam diameter data; collimator design; colorful beam measurements; electron beam diameter; electron beam shape; fast beam imaging diagnostics; fast gated imaging tube; flash X-ray machine; framing camera; kapton target insertion mechanism; pulse generation; Cameras; Colliding beam accelerators; Diagnostic radiography; Electron accelerators; Electron beams; Laboratories; Linear accelerators; Optical imaging; Particle accelerators; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5498-2
  • Type

    conf

  • DOI
    10.1109/PPC.1999.823592
  • Filename
    823592