DocumentCode :
1632416
Title :
Fault partitioning issues in an integrated parallel test generation/fault simulation environment
Author :
Patil, Srinivas ; Banerjee, Prith
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
fYear :
1989
Firstpage :
718
Lastpage :
726
Abstract :
The authors address the issues involved in providing an integrated test generation/fault simulation environment on a parallel processor. They propose heuristics to partition faults for parallel test generation with minimization of the overall run time and test length as an objective. For efficient utilization of available processors, the work load has to be balanced at all times. Since it is very difficult to predict a priori how difficult it is to generate a test for a particular fault, the authors propose a load-balancing method which uses static partitioning initially and then dynamic allocation of work for processors which become idle. They present experimental results based on an implementation on the Intel iPSC/2 hypercube multiprocessor using the ISCAS combinational benchmark circuits. The main contribution of the work described is to show that if one is not careful in the design of a parallel algorithm, apart from inefficient utilization of available processors, degradation in the quality of solutions can occur
Keywords :
VLSI; automatic testing; circuit CAD; combinatorial circuits; fault location; integrated logic circuits; logic CAD; logic testing; parallel algorithms; ISCAS combinational benchmark circuits; Intel iPSC/2 hypercube multiprocessor; VLSI CAD; dynamic allocation; fault partitioning; heuristics; integrated parallel test generation/fault simulation environment; load-balancing; parallel processor; run time; static partitioning; Benchmark testing; Circuit faults; Circuit testing; Computational modeling; Contracts; Hardware; Hypercubes; Logic testing; Parallel processing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/TEST.1989.82360
Filename :
82360
Link To Document :
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