DocumentCode :
1632725
Title :
Noise in sensor crystals: hermetically sealed and unsealed
Author :
Kim, Yoonkee ; Vig, John R.
Author_Institution :
US Army CECOM, Fort Monmouth, NJ, USA
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
551
Lastpage :
555
Abstract :
Noise limits the accuracy with which the frequency of an oscillator can be determined. Similarly, in a resonant sensor, noise limits the measurement resolution, i.e., it limits the minimum quantity of a measurand that can be measured with a specified uncertainty. In some sensor applications, such as in quartz crystal microbalances (e.g., chemical sensors), the sensor crystals are not hermetically sealed. The noise [σy(τ) at several τ] of hermetically sealed 5 MHz fundamental mode AT-cut quartz resonators was measured at laboratory ambient temperature, and in an oven near the turnover temperatures (83°C). Then the hermetic seals were broken and the resonators were measured again at ambient and turnover temperatures. As one would expect, breaking the hermetic seal increased the equivalent series resistance and the aging of the resonators. When the resonators were in the oven near their turnover temperatures, the unsealed resonators´ (drift-removed) short-term stability was not significantly different from that of the sealed ones. In fact, in some cases, the unsealed resonators exhibited better short term stability. The noise due to temperature fluctuations at laboratory ambient temperatures dominated the effects of breaking the hermetic seal
Keywords :
1/f noise; crystal resonators; equivalent circuits; frequency stability; microbalances; phase noise; seals (stoppers); 83 C; SiO2; equivalent circuit parameters; frequency-temperature curve; fundamental mode AT-cut resonators; hermetically sealed; quartz crystal microbalances; quartz resonators; seal breaking; sensor crystals; short-term stability; temperature fluctuations; unsealed resonators; Chemical sensors; Crystals; Electrical resistance measurement; Frequency; Hermetic seals; Laboratories; Noise measurement; Ovens; Stability; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
Conference_Location :
Seattle, WA
ISSN :
1075-6787
Print_ISBN :
0-7803-7028-7
Type :
conf
DOI :
10.1109/FREQ.2001.956338
Filename :
956338
Link To Document :
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