Dielectric properties of the system AgI-CuI-CsI

Author

Nalini, B. ; Selvaskarapandian, S.

Author_Institution

Dept. of Phys., Bharathiar Univ., Coimbatore, India

Volume

1

fYear

1997

Firstpage

62

Abstract

The dielectric properties of the system AgI-CuI-CsI with four molar ratios namely 90-05-05, 70-15-15, 50-25-25 and 30-35-35 have been measured and the results discussed. The relaxational frequencies have been calculated and the activation energies obtained suggest the conduction to be mainly due to silver ions only. The conduction mechanism has been observed to be due to a hopping mechanism of ions irrespective of the variation in the molar ratio. The electronic conductivity measurement shows the presence of electronic conduction in all the samples

Keywords

caesium compounds; copper compounds; dielectric losses; dielectric relaxation; hopping conduction; mixed conductivity; permittivity; silver compounds; solid electrolytes; superionic conductivity; Ag ions; AgI-CuI-CsI; Agl-Cul-Csl system; activation energies; conduction mechanism; dielectric properties; electronic conduction; electronic conductivity measurement; highly ionic conducting solid electrolytes; hopping mechanism; ion hopping; molar ratios; relaxational frequencies; Dielectric constant; Frequency response;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on

Conference_Location

Seoul

Print_ISBN

0-7803-2651-2

Type

conf

DOI

10.1109/ICPADM.1997.617528

Filename

617528